Package org.rcsb.cif.schema.core
Class DiffrnMeasurement
java.lang.Object
org.rcsb.cif.schema.DelegatingCategory.DelegatingCifCoreCategory
org.rcsb.cif.schema.core.DiffrnMeasurement
- All Implemented Interfaces:
Category
@Generated("org.rcsb.cif.schema.generator.SchemaGenerator")
public class DiffrnMeasurement
extends DelegatingCategory.DelegatingCifCoreCategory
The CATEGORY of data items which specify the details of the
diffraction measurement.
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Nested Class Summary
Nested classes/interfaces inherited from interface org.rcsb.cif.model.Category
Category.EmptyCategory -
Field Summary
Fields inherited from class org.rcsb.cif.schema.DelegatingCategory.DelegatingCifCoreCategory
parentBlock -
Constructor Summary
Constructors Constructor Description DiffrnMeasurement(CifCoreBlock parentBlock) -
Method Summary
Modifier and Type Method Description StrColumngetDetails()Description of special aspects of the diffraction measurement.StrColumngetDevice()Type of goniometer device used to mount and orient the specimen.StrColumngetDeviceClass()Type of goniometer device used to mount and orient the specimen.StrColumngetDeviceDetails()Details of the goniometer device used in the diffraction experiment.StrColumngetDeviceMake()The make, model or name of the goniometer device used.StrColumngetDeviceType()The make, model or name of the goniometer device used.StrColumngetMethod()Description of scan method used to measure diffraction intensities.StrColumngetSpecimenSupport()Mounting method for the crystal specimum during data collection.Methods inherited from class org.rcsb.cif.schema.DelegatingCategory.DelegatingCifCoreCategory
getCategoryName, getColumn, getColumns, getRowCount
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Constructor Details
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Method Details
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getDetails
Description of special aspects of the diffraction measurement.- Returns:
- StrColumn
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getDevice
Type of goniometer device used to mount and orient the specimen.- Returns:
- StrColumn
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getDeviceClass
Type of goniometer device used to mount and orient the specimen.- Returns:
- StrColumn
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getDeviceDetails
Details of the goniometer device used in the diffraction experiment.- Returns:
- StrColumn
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getDeviceType
The make, model or name of the goniometer device used.- Returns:
- StrColumn
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getDeviceMake
The make, model or name of the goniometer device used.- Returns:
- StrColumn
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getMethod
Description of scan method used to measure diffraction intensities.- Returns:
- StrColumn
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getSpecimenSupport
Mounting method for the crystal specimum during data collection.- Returns:
- StrColumn
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