Package org.rcsb.cif.schema.mm
Class DiffrnMeasurement
java.lang.Object
org.rcsb.cif.schema.DelegatingCategory
org.rcsb.cif.schema.mm.DiffrnMeasurement
- All Implemented Interfaces:
Category
@Generated("org.rcsb.cif.schema.generator.SchemaGenerator")
public class DiffrnMeasurement
extends DelegatingCategory
Data items in the DIFFRN_MEASUREMENT category record details
about the device used to orient and/or position the crystal
during data measurement and the manner in which the diffraction
data were measured.
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Nested Class Summary
Nested classes/interfaces inherited from class org.rcsb.cif.schema.DelegatingCategory
DelegatingCategory.DelegatingCifCoreCategoryNested classes/interfaces inherited from interface org.rcsb.cif.model.Category
Category.EmptyCategory -
Field Summary
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Constructor Summary
Constructors Constructor Description DiffrnMeasurement(Category delegate) -
Method Summary
Modifier and Type Method Description protected ColumncreateDelegate(String columnName, Column column)StrColumngetDetails()A description of special aspects of the intensity measurement.StrColumngetDevice()The general class of goniometer or device used to support and orient the specimen.StrColumngetDeviceDetails()A description of special aspects of the device used to measure the diffraction intensities.StrColumngetDeviceType()The make, model or name of the measurement device (goniometer) used.StrColumngetDiffrnId()This data item is a pointer to _diffrn.id in the DIFFRN category.StrColumngetMethod()Method used to measure intensities.StrColumngetPdbxDate()The date of data measurementStrColumngetSpecimenSupport()The physical device used to support the crystal during data collection.Methods inherited from class org.rcsb.cif.schema.DelegatingCategory
getCategoryName, getColumn, getColumns, getRowCount
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Constructor Details
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Method Details
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createDelegate
- Overrides:
createDelegatein classDelegatingCategory
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getDiffrnId
This data item is a pointer to _diffrn.id in the DIFFRN category.- Returns:
- StrColumn
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getDetails
A description of special aspects of the intensity measurement.- Returns:
- StrColumn
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getDevice
The general class of goniometer or device used to support and orient the specimen.- Returns:
- StrColumn
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getDeviceDetails
A description of special aspects of the device used to measure the diffraction intensities.- Returns:
- StrColumn
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getDeviceType
The make, model or name of the measurement device (goniometer) used.- Returns:
- StrColumn
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getMethod
Method used to measure intensities.- Returns:
- StrColumn
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getSpecimenSupport
The physical device used to support the crystal during data collection.- Returns:
- StrColumn
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getPdbxDate
The date of data measurement- Returns:
- StrColumn
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