Package org.rcsb.cif.schema.mm
Class EmImaging
java.lang.Object
org.rcsb.cif.schema.DelegatingCategory
org.rcsb.cif.schema.mm.EmImaging
- All Implemented Interfaces:
Category
@Generated("org.rcsb.cif.schema.generator.SchemaGenerator")
public class EmImaging
extends DelegatingCategory
Data items in the EM_IMAGING category record details about
the parameters used in imaging the sample in the electron microscope.
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Nested Class Summary
Nested classes/interfaces inherited from class org.rcsb.cif.schema.DelegatingCategory
DelegatingCategory.DelegatingCifCoreCategoryNested classes/interfaces inherited from interface org.rcsb.cif.model.Category
Category.EmptyCategory -
Field Summary
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Constructor Summary
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Method Summary
Modifier and Type Method Description protected ColumncreateDelegate(String columnName, Column column)IntColumngetAcceleratingVoltage()A value of accelerating voltage (in kV) used for imaging.StrColumngetAlignmentProcedure()microscope alignment procedureStrColumngetAstigmatism()astigmatismFloatColumngetC2ApertureDiameter()The open diameter of the c2 condenser lens, in microns.FloatColumngetCalibratedDefocusMax()The maximum defocus value of the objective lens (in nanometers) used to obtain the recorded images.FloatColumngetCalibratedDefocusMin()The minimum defocus value of the objective lens (in nanometers) used to obtain the recorded images.IntColumngetCalibratedMagnification()The magnification value obtained for a known standard just prior to, during or just after the imaging experiment.StrColumngetCitationId()This data item is a pointer to _citation.id in the CITATION category.StrColumngetCryogen()Cryogen type used to maintain the specimen stage temperature during imaging in the microscope.StrColumngetDate()Date (YYYY-MM-DD) of imaging experiment or the date at which a series of experiments began.StrColumngetDetails()Any additional imaging details.FloatColumngetDetectorDistance()The camera length (in millimeters).StrColumngetDetectorId()The value of _em_imaging.detector_id must uniquely identify the type of detector used in the experiment.StrColumngetElectronBeamTiltParams()electron beam tilt paramsFloatColumngetElectronDose()The electron dose received by the specimen (electrons per square angstrom).StrColumngetElectronSource()The source of electrons.StrColumngetEnergyFilter()The type of energy filter spectrometer apparatus.StrColumngetEnergyWindow()The energy filter range in electron volts (eV)set by spectrometer.StrColumngetEntryId()This data item is a pointer to _entry.id in the ENTRY category.StrColumngetId()The value of _em_imaging.id must uniquely identify each imaging experiment.StrColumngetIlluminationMode()The mode of illumination.StrColumngetMicroscopeId()This data item is a pointer to _em_microscope.id in the EM_MICROSCOPE category.StrColumngetMicroscopeModel()The name of the model of microscope.StrColumngetMode()The mode of imaging.FloatColumngetNominalCs()The spherical aberration coefficient (Cs) in millimeters, of the objective lens.FloatColumngetNominalDefocusMax()The maximum defocus value of the objective lens (in nanometers) used to obtain the recorded images.FloatColumngetNominalDefocusMin()The minimum defocus value of the objective lens (in nanometers) used to obtain the recorded images.IntColumngetNominalMagnification()The magnification indicated by the microscope readout.FloatColumngetRecordingTemperatureMaximum()The specimen temperature maximum (degrees Kelvin) for the duration of imaging.FloatColumngetRecordingTemperatureMinimum()The specimen temperature minimum (degrees Kelvin) for the duration of imaging.FloatColumngetResidualTilt()residual tilt of the electron beamStrColumngetSampleSupportId()This data item is a pointer to _em_sample_support.id in the EM_SAMPLE_SUPPORT category.StrColumngetScansId()The value of _em_imaging.scans_id must uniquely identify the image_scans used in the experiment.StrColumngetSpecimenHolderModel()The name of the model of specimen holder used during imaging.StrColumngetSpecimenHolderType()The type of specimen holder used during imaging.StrColumngetSpecimenId()Foreign key to the EM_SPECIMEN categoryFloatColumngetTemperature()The mean specimen stage temperature (degrees Kelvin) during imaging in the microscope.FloatColumngetTiltAngleMax()The maximum angle at which the specimen was tilted to obtain recorded images.FloatColumngetTiltAngleMin()The minimum angle at which the specimen was tilted to obtain recorded images.Methods inherited from class org.rcsb.cif.schema.DelegatingCategory
getCategoryName, getColumn, getColumns, getRowCount
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Constructor Details
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Method Details
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createDelegate
- Overrides:
createDelegatein classDelegatingCategory
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getEntryId
This data item is a pointer to _entry.id in the ENTRY category.- Returns:
- StrColumn
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getId
The value of _em_imaging.id must uniquely identify each imaging experiment.- Returns:
- StrColumn
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getAstigmatism
astigmatism- Returns:
- StrColumn
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getElectronBeamTiltParams
electron beam tilt params- Returns:
- StrColumn
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getResidualTilt
residual tilt of the electron beam- Returns:
- FloatColumn
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getSampleSupportId
This data item is a pointer to _em_sample_support.id in the EM_SAMPLE_SUPPORT category.- Returns:
- StrColumn
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getDetectorId
The value of _em_imaging.detector_id must uniquely identify the type of detector used in the experiment.- Returns:
- StrColumn
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getScansId
The value of _em_imaging.scans_id must uniquely identify the image_scans used in the experiment.- Returns:
- StrColumn
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getMicroscopeId
This data item is a pointer to _em_microscope.id in the EM_MICROSCOPE category.- Returns:
- StrColumn
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getMicroscopeModel
The name of the model of microscope.- Returns:
- StrColumn
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getSpecimenHolderType
The type of specimen holder used during imaging.- Returns:
- StrColumn
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getSpecimenHolderModel
The name of the model of specimen holder used during imaging.- Returns:
- StrColumn
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getDetails
Any additional imaging details.- Returns:
- StrColumn
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getDate
Date (YYYY-MM-DD) of imaging experiment or the date at which a series of experiments began.- Returns:
- StrColumn
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getAcceleratingVoltage
A value of accelerating voltage (in kV) used for imaging.- Returns:
- IntColumn
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getIlluminationMode
The mode of illumination.- Returns:
- StrColumn
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getMode
The mode of imaging.- Returns:
- StrColumn
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getNominalCs
The spherical aberration coefficient (Cs) in millimeters, of the objective lens.- Returns:
- FloatColumn
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getNominalDefocusMin
The minimum defocus value of the objective lens (in nanometers) used to obtain the recorded images.- Returns:
- FloatColumn
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getNominalDefocusMax
The maximum defocus value of the objective lens (in nanometers) used to obtain the recorded images.- Returns:
- FloatColumn
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getCalibratedDefocusMin
The minimum defocus value of the objective lens (in nanometers) used to obtain the recorded images.- Returns:
- FloatColumn
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getCalibratedDefocusMax
The maximum defocus value of the objective lens (in nanometers) used to obtain the recorded images.- Returns:
- FloatColumn
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getTiltAngleMin
The minimum angle at which the specimen was tilted to obtain recorded images.- Returns:
- FloatColumn
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getTiltAngleMax
The maximum angle at which the specimen was tilted to obtain recorded images.- Returns:
- FloatColumn
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getNominalMagnification
The magnification indicated by the microscope readout.- Returns:
- IntColumn
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getCalibratedMagnification
The magnification value obtained for a known standard just prior to, during or just after the imaging experiment.- Returns:
- IntColumn
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getElectronSource
The source of electrons. The electron gun.- Returns:
- StrColumn
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getElectronDose
The electron dose received by the specimen (electrons per square angstrom).- Returns:
- FloatColumn
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getEnergyFilter
The type of energy filter spectrometer apparatus.- Returns:
- StrColumn
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getEnergyWindow
The energy filter range in electron volts (eV)set by spectrometer.- Returns:
- StrColumn
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getCitationId
This data item is a pointer to _citation.id in the CITATION category.- Returns:
- StrColumn
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getTemperature
The mean specimen stage temperature (degrees Kelvin) during imaging in the microscope.- Returns:
- FloatColumn
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getDetectorDistance
The camera length (in millimeters). The camera length is the product of the objective focal length and the combined magnification of the intermediate and projector lenses when the microscope is operated in the diffraction mode.- Returns:
- FloatColumn
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getRecordingTemperatureMinimum
The specimen temperature minimum (degrees Kelvin) for the duration of imaging.- Returns:
- FloatColumn
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getRecordingTemperatureMaximum
The specimen temperature maximum (degrees Kelvin) for the duration of imaging.- Returns:
- FloatColumn
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getAlignmentProcedure
microscope alignment procedure- Returns:
- StrColumn
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getC2ApertureDiameter
The open diameter of the c2 condenser lens, in microns.- Returns:
- FloatColumn
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getSpecimenId
Foreign key to the EM_SPECIMEN category- Returns:
- StrColumn
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getCryogen
Cryogen type used to maintain the specimen stage temperature during imaging in the microscope.- Returns:
- StrColumn
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